Knowledge Tree

researcher / Johnny El beyrouthy

Johnny El beyrouthy

at_id:

orcid_id:

Disciplines:

Electrical engineering

Edit Merge See Links

Thesis:

Characterization and modeling of low frequencies noise in bipolar transistors developed in BiCMOS technology (55 nm node) for RF to THz applicationsés en technologie BiCMOS (nœud 55 nm) pour des applications RF et THz.